The TEM FEI Titan™ Themis provides easy access to atomic information about electron transparent samples. The microscope combines high-brightness X-FEG module with monochromator, 3-lens condenser, SUPER-X EDX detector, image (Cs)-corrector and high-end GATAN GIF Quantum ERS/966 energy filter for EELS and EFTEM to achieve comprehensive results. Thanks to new enhanced piezo stage, FEI Ceta 4kx4k 16-bit CMOS camera, multiple STEM detectors (BF, ADF and HAADF), variation of analytical holders (ST, DT, Tomographic and Cryo), implemented Lorentz lens and sophisticated SWs for data acquisition and post-processing the microscope can be used as a complex and automated tool for materials science.
FEI TITAN 3 Themis 60-300 TEM microscope
The Jeol 2100 LaB6 is a transmission electron microscope (TEM) capable of high resolution images and suitable for a wide range of samples, from nanomaterials to those from the biological sciences. It is the modern day equivelent of our Jeol 2000fx, with the improvements one would expect from 30 years of technological advances.
The 2100 LaB6 can be used in scanning mode (STEM), using a probe down to 1.5 nm in size. Bright field (BF) and annular dark field (ADF) images can be collected simultaneously to provide information on the chemical composition of a sample.
Jeol 2100 LaB6 microscope
The Thermo Scientific™ Talos F200X scanning/transmission electron microscope (S/TEM) combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping. The Talos F200X S/TEM allows for the fastest and most precise EDS analysis in all dimensions (1D-4D), along with the best HRTEM imaging with fast navigation for dynamic microscopy. The Talos F200X S/TEM does all this while also providing the highest stability and longest uptime
Talos F200X microscope
The Nova NanoSEM scanning electron microscope delivers best-in-class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables you to gain the most comprehensive answers in the least amount of time. This propels productivity without sacrificing the quality imaging you demand from your daily work.
Surface sensitivity is delivered without sacrificing resolution – Characterize a wide range of samples with unique low vacuum capabilities and ultra-high resolution low voltage imaging; low voltage [1kV] resolution is 1.4 nm in high vacuum mode, while for non-conductive materials, the Nova NanoSEM is unique in offering the highest resolution (1.8nm) at low voltages (3kV).
FEI Nova NanoSEM 450
Kratos Axis Ultra DLD spectrophotometer with high performance, with capacity for the following techniques: XPS (X-ray Photoelectron Spectroscopy), AES / SEM (Auger Electron Spectroscopy / Scanning Electron Microscopy) and ISS (Ion Scattering Spectroscopy). The equipment is equipped with a chamber for chemical/thermal treatments in situ, which allows to work with different gases at pressures between 1 and 6 bar, in conditions of ultra-high vacuum, and at temperatures up to 1000 ° C. It also allows to perform studies at different depths of the chemical composition of areas close to the surface, by roughing with Ar + ions (depth profiles), or by means of ARXPS (Angle-Resolved XPS). Possibility of carrying out the analysis of the samples at temperatures between -100 and 600 ° C. In addition, with regard to the XPS technique, it is possible to obtain images of XPS (XPS imaging), which allows to obtain a map with the distribution of the different chemical elements along the studied surfaces, being able to obtain data on the two-dimensional uniformity of the studied surface.
XPS Axis Kratos ultra DLD
Cathodoluminescence (CL) is used to characterize optical properties at the nanoscale. The power of cathodoluminescence is the combination of functional optical information with the high spatial resolution of electron microscopy. Cathodoluminescence combines functional optical information with the superior spatial resolution associated with electron microscopy.
In order to collect the CL signal a parabolic mirror is introduced between he sample and the polar piece (objective lens) of the microscope. The signal one is then sent to monochromator followed by a CCD camera. Our home-made CL system permits obtain information from photons (generated by e-beam-materials interaction) by two different appoaches: i) CL spectrum collected in the ultraviolet to near-infrared region of the electromagnetic spectrum ii) CL mapping obtained by scanning the electron beam on the surface of the sample while detecting in parallel the emitted CL.
Home-made CL system
The Quanta 200 3D is a dual-beam scanning electron microscope (SEM) and focused ion beam (FIB) instrument. Combining these two techniques creates a versatile tool for sub-micron scale material removal and characterization. This microscope is mainly usedfor preparing site-specific cross sectional specimens for transmission electron microscopes (TEM).
FIB Quanta 200 3D with Selecting Carbon Milling Injector
The Precision Ion Polishing System (PIPS) is used for thinning and/or polishing of samples for transmission electron microscopy (TEM) analysis. Since the ion polishing process is rather slow it is important that the samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The instrument is equipped with two Penning ion guns (PIGs) using argon (AR) ions for sputtering and polishing. The operating angles of the guns are ± 10°, and the accelerating voltage can be varied between 0.1 kV to 6.0 kV.
The typical starting thickness of the sample should be around a few ten microns. The PIPS can accept several different sample geometries but the standard shape of the sample is a 3 mm diameter disc.
Gatan PIPS system Model 691
Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control.
Ion polisher TEM Mill Fischione 1050